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  1. Preface
  2. Introduction to Test Data Management
  3. Test Data Manager
  4. Projects
  5. Policies
  6. Data Discovery
  7. Creating a Data Subset
  8. Performing a Data Masking Operation
  9. Data Masking Techniques and Parameters
  10. Data Generation
  11. Data Generation Techniques and Parameters
  12. Working with Test Data Warehouse
  13. Analyzing Test Data with Data Coverage
  14. Plans and Workflows
  15. Monitor
  16. Reports
  17. ilmcmd
  18. tdwcmd
  19. tdwquery
  20. Data Type Reference
  21. Data Type Reference for Test Data Warehouse
  22. Glossary

Date Random Masking Parameters

Date Random Masking Parameters

To mask datetime values with random masking, either configure a range of output dates or choose a variance.
When you configure a variance, choose a part of the date to blur. Choose the year, month, day, hour, minute, or second. The
PowerCenter Integration Service
returns a date that is within the range you configure.
The following table describes the parameters that you can configure for random masking of datetime values:
Parameter
Description
Range
The minimum and maximum values to return for the selected datetime value. The date range is a fixed variance.
Blurring
Masks a date based on a variance that you apply to a unit of the date. The
PowerCenter Integration Service
returns a date that is within the variance. You can blur the year, month, day, or hour. Choose a low and high variance to apply.