Table of Contents

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  1. Preface
  2. Introduction to Test Data Management
  3. Test Data Manager
  4. Projects
  5. Policies
  6. Data Discovery
  7. Data Subset
  8. Data Masking
  9. Data Masking Techniques and Parameters
  10. Data Generation
  11. Data Generation Techniques and Parameters
  12. Data Sets
  13. Plans and Workflows
  14. Monitor
  15. Reports
  16. ilmcmd
  17. tdwcmd
  18. tdwquery
  19. Data Type Reference
  20. Data Type Reference for Test Data Warehouse
  21. Data Type Reference for Hadoop
  22. Glossary

Create a Plan for Data Masking and Data Subset

Create a Plan for Data Masking and Data Subset

Create a plan for the data masking and data subset operations. A plan includes the components that you need to generate a workflow. You can combine a data masking and a data subset operation in the same plan, or you can create separate plans. To save the results to an integrated HP ALM server or to store the results in the test data warehouse, select the appropriate properties in the plan.
  1. Create a data subset plan and add the entities, groups, and templates to it. You can define additional criteria to filter the data.
  2. Create a data masking plan and assign the policies and rules to the plan that you want to apply.
  3. To store the results in the test data warehouse, select the test data warehouse from the list of target connections in the plan.
  4. To also copy flat file target results to an integrated HP ALM server, enter the test tool integration properties in the plan.
  5. Generate a workflow from the plan.
  6. Run the workflow.
When you generate and run workflows from plans, the PowerCenter Integration Service runs the workflows and loads the data into the target database.