Table of Contents

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  1. Preface
  2. Introduction to Test Data Management
  3. Test Data Manager
  4. Projects
  5. Policies
  6. Data Discovery
  7. Creating a Data Subset
  8. Performing a Data Masking Operation
  9. Data Masking Techniques and Parameters
  10. Data Generation
  11. Data Generation Techniques and Parameters
  12. Working with Test Data Warehouse
  13. Analyzing Test Data with Data Coverage
  14. Plans and Workflows
  15. Monitor
  16. Reports
  17. ilmcmd
  18. tdwcmd
  19. tdwquery
  20. Data Type Reference
  21. Data Type Reference for Test Data Warehouse
  22. Data Type Reference for Hadoop
  23. Glossary

Rules and Guidelines for Shuffle Masking

Rules and Guidelines for Shuffle Masking

The results of a shuffle masking rule might differ based on the data, connections, and other plan properties.
Consider the following rules and guidelines when you use shuffle masking in a plan:
  • The Content Management Service cannot create reference tables for JDBC connection types in the following situations:
    • A table has a column of Varchar2 or Varchar data type with a precision greater than 2000.
    • A table has a column of Char data type with a precision greater than 1000.
    When you run the workflow, if the column precision is greater, the workflow resets the precision to 2000 for Varchar2 or Varchar and 1000 for Char data types. This might result in truncation of data.