Table of Contents

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  1. Preface
  2. Introduction to Test Data Management
  3. Test Data Manager
  4. Projects
  5. Policies
  6. Data Discovery
  7. Creating a Data Subset
  8. Performing a Data Masking Operation
  9. Data Masking Techniques and Parameters
  10. Data Generation
  11. Data Generation Techniques and Parameters
  12. Working with Test Data Warehouse
  13. Analyzing Test Data with Data Coverage
  14. Plans and Workflows
  15. Monitor
  16. Reports
  17. ilmcmd
  18. tdwcmd
  19. tdwquery
  20. Data Type Reference
  21. Data Type Reference for Test Data Warehouse
  22. Data Type Reference for Hadoop
  23. Glossary

Create a Plan for Data Generation

Create a Plan for Data Generation

Create a plan to perform data generation operations. You cannot combine a data generation operation with a data masking or a data subset operation in the same plan. You must create a separate plan for data generation. To save the results to an integrated HP ALM server or to store the results in the test data warehouse, select the appropriate properties in the plan.
Perform the following tasks when you want to create a data generation plan:
  1. Create a data generation plan and add the tables and entities. You can define additional criteria to filter the data.
  2. Enter the number of records that you want to generate.
  3. To store the results in the test data warehouse, select the test data warehouse from the list of target connections in the plan.
  4. To also copy flat file target results to an integrated HP ALM server, enter the test tool integration properties in the plan.
  5. Generate a workflow from the plan.
  6. Run the workflow.