Table of Contents

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  1. Preface
  2. Introduction to Test Data Management
  3. Test Data Manager
  4. Projects
  5. Policies
  6. Data Discovery
  7. Creating a Data Subset
  8. Performing a Data Masking Operation
  9. Data Masking Techniques and Parameters
  10. Data Generation
  11. Data Generation Techniques and Parameters
  12. Working with Test Data Warehouse
  13. Analyzing Test Data with Data Coverage
  14. Plans and Workflows
  15. Monitor
  16. Reports
  17. ilmcmd
  18. tdwcmd
  19. tdwquery
  20. Appendix A: Data Type Reference
  21. Appendix B: Data Type Reference for Test Data Warehouse
  22. Appendix C: Data Type Reference for Hadoop
  23. Appendix D: Glossary

Data Generation for XSD Sources

Data Generation for XSD Sources

You can apply data generation rules to XML elements and attributes to generate test data.
View and open the XSD file from the
Discover | Files
view of the project. You can view the details of the XML elements and attributes in the XSD map view or the grid view.
Select an element, and apply a data generation rule to the element. You can select a link between the elements and specify the minimum and maximum number of child records for each parent to generate test data.
You can select multiple elements and assign a default generation rule to the selected elements. You can remove all the default generation rule assignments, and assign another generation rule.
You can assign standard and custom generation rules to generate test data in XSD sources. You can include conditional constraints in advanced rules.
You cannot use reference lookup and effective dates generation rules for an XSD source.